Crest Confocal

 

Objectives

CFI Plan Apochromat λD 10X (NA 0.45) Dry

CFI Plan Apochromat λD 20X (NA 0.8) Dry

CFI Plan Apochromat λD 60X (NA 0.42) Oil

PlanapoλS CFI SRHP S 100X (NA 1.4) Sil

PlanapoλS CFI 25X (NA 1.05) Sil

 

Laserlines (solid state)

405 nm

446 nm

477 nm

520 nm

546 nm

638 nm

749 nm

reso

Specifics

Brightfield (contrast): yes (DIC);

Fluor: yes;

Sensor: GaAsP

Max resolution: 4096 x 4096

16-bit dynamic range

Z section: yes;

Time lapse: yes;

ROI Bleaching: yes;

Other: mortorized stage, environment control, DeepSIM Module for super-resolution

DESCRIPTION

Crest X-Light V3 relies on cutting-edge technology, optical design, and engineering solutions developed by CrestOptics to meet the specific requirements of high-end microscopy applications.

All features are designed to extract the maximum amount and highest quality of data from each individual sample, from fast cellular dynamics in live specimens to the clarity of optical sectioning in cleared tissues.

Among these, the illumination homogeneity achieved through microlens technology makes X-Light V3 the fastest system for both qualitative and quantitative imaging of large samples.

.This next-generation spinning disk system is optimized for as an exceptionally flexible solution for laboratories focused on high-resolution imaging, dynamic live-cell experiments, and advanced optical sectioning.

The DeepSIM module allow researchers to easily enhance their imaging capabilities from widefield to confocal to super-resolution (up to 100nm XY; 300nm Z)